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QTECH NANOSYSTEMS PTE LTD
Quantum Leaps in Nano World and Beyond
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SCANNING PROBE MICROSCOPY

SPM using Nanopositioning
Atomic Force Microscopy

Electrostatic Force Microscope

Force Modulation Microscopy

Magnetic Resonance Force Microscopy

Near-Field Scanning Optical Microscopy

Scanning Tunnelling Microscopy

Almost all SPM need Nanopositioning systems


TECHNOLOGY
The scanning probe microscopy covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms. A fine probe positioned within a few nanometers above the sample to be studied, scans across them at very faster rate. In these microscopes singles are generated by the probe by scanning the horizontal plane for position and vertical directions for distance from the surface. With these signals image of the topography is created in the same way that an electron beam scans a CR Tube. In some scanning probe microscopes the probe is designed to sense a specific physical or chemical property of the surface, such as magnetic field strength, heat capacity, or refractive index. 3D map of the property with atomic or molecular resolution is obtained. Since conventional electron microscope require vacuum environment, biological samples are not suitable to image for details. Not only this, dynamic processes can also be imaged directly. Usually images at the atomic scale introduce some distortion and hence computer algorithms are used to correct them. Qtech Nanosystems uses high precision closed-loop control systems with which SPMs can perform accurate metrology without or with customized software. In any scanning probe microscopy applications, precise displacement at regular interval (scanning) is crucial. When considering micro and nano applications, errors even in atomic level not permissible. Exactly linear displacement at very high speed for longer range displacement and sub atomic level repeatability determine the success and true quality functionality of any scanning probe microscopy. There are numerous variations on these techniques. AFM may operate in several modes which differ according to the force between the tip and surface. Scanning technologies in micron and nano applications normally need very high speed scanning, high stiffness and high bandwidth. During scanning, precision has to be maintained all along the “way” in order for instruments images or manipulates nanostructures and microbes or nanobes.


QTECH'S TECHNOLOGICAL SOLUTIONS

Mechanical Stage:Monolithic Compound Flexures with Amplifier stages

Actuator: Solid stage actuators (piezo)

Driver:Programmed power drivers with feedback systems User programmable

Sensor: Capacitive, Eddy or Tunneling Sensor

Software: custom made software. Additional facility to integrate with instruments is present for data retrieval.
APPLICATION SEGMENTS OF NANOLITHOGRAPHY
Nanotechnology
Biotechnology, Life Sciences, Medicine
Material Science (Smart & Nanomaterials)
Semiconductor
Electronics

SPECIFICAIONS